Title: Q factor and frequency data for parallel plate resonator calibration

Gumbleton R, Hefford S, Cuenca JA, et al. (2020). Q factor and frequency data for parallel plate resonator calibration. Cardiff University. http://doi.org/10.17035/d.2020.0113563620

Access Rights: Data is provided under a Creative Commons Attribution (CC BY 4.0) licence
Access Method: Click to email a request for this data to opendata@cardiff.ac.uk

Dataset Details
Publisher: Cardiff University
Date (year) of data becoming publicly available: 2020
Data format: .xlsx
Estimated total storage size of dataset: Less than 100 megabytes
Number of Files In Dataset: 1
DOI: 10.17035/d.2020.0113563620


Microwave surface resistance is evaluated using a novel parallel plate resonator fixture through the direct measurment of Quality factor and resoant frequency. 

Measurment data is available in .xlsx format, where measurments for each samples plate are recorded as coloum entries consiting of Frequency (Hz), Quailty factor and evaluated surface resistance(Ohms). Each table row corresponds to repeated measurment results. Samples measured include buk Al6082 and silver plated Al6082 as well as additive manufactured AlSi10Mg and Ti6Al4V.

All measurments have been taken on a Keysight PNA under standard laboratory conditions.  

Research results based upon these data are published at http://doi.org/10.1109/TMTT.2020.3035082

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Last updated on 2021-20-01 at 15:21

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