Teitl: Q factor and frequency data for parallel plate resonator calibration

Dyfyniad
Gumbleton R, Hefford S, Cuenca JA, et al. (2020). Q factor and frequency data for parallel plate resonator calibration. Cardiff University. http://doi.org/10.17035/d.2020.0113563620


Hawliau Mynediad: Darperir Data dan drwydded Creative Commons Attribution (CC BY 4.0)
Dull Mynediad: I anfon cais i gael y data hwn, ebostiwch opendata@caerdydd.ac.uk

Manylion y Set Ddata
Cyhoeddwr: Cardiff University
Dyddiad (y flwyddyn) pryd y daeth y data ar gael i'r cyhoedd: 2020
Fformat y data: .xlsx
Amcangyfrif o gyfanswm maint storio'r set ddata: Llai na 100 megabeit
Nifer y ffeiliau yn y set ddata: 1
DOI: 10.17035/d.2020.0113563620

Disgrifiad

Microwave surface resistance is evaluated using a novel parallel plate resonator fixture through the direct measurment of Quality factor and resoant frequency. 

Measurment data is available in .xlsx format, where measurments for each samples plate are recorded as coloum entries consiting of Frequency (Hz), Quailty factor and evaluated surface resistance(Ohms). Each table row corresponds to repeated measurment results. Samples measured include buk Al6082 and silver plated Al6082 as well as additive manufactured AlSi10Mg and Ti6Al4V.

All measurments have been taken on a Keysight PNA under standard laboratory conditions.  

Research results based upon these data are published at http://doi.org/10.1109/TMTT.2020.3035082



Prosiectau Cysylltiedig

Diweddarwyd y tro diwethaf ar 2021-20-01 am 15:21