Title: Simultaneous microscopic imaging of thickness and refractive index of thin layers by heterodyne interferometric reflectometry (HiRef) - data


Citation
Nahmad-Rohen A, Regan D, Borri P, et al. (2021). Simultaneous microscopic imaging of thickness and refractive index of thin layers by heterodyne interferometric reflectometry (HiRef) - data. Cardiff University. http://doi.org/10.17035/d.2021.0136335474



Access Rights: Data is provided under a Creative Commons Attribution (CC BY 4.0) licence

Access Method: Click to email a request for this data to opendata@cardiff.ac.uk


Dataset Details

Publisher: Cardiff University

Date (year) of data becoming publicly available: 2021

Data format: tiff, ascii

Software Required: ImageJ

Estimated total storage size of dataset: Less than 1 gigabyte

Number of Files In Dataset: 100

DOI : 10.17035/d.2021.0136335474

DOI URL: http://doi.org/10.17035/d.2021.0136335474


Description

This dataset contains
1) Simulated HiRef signals as function of film refractive index, thickness, and objective numerical aperture
2) Measured HiRef and qDIC data on PVA films and lipid bilayers
3) Analysed thickness and refractive index of the layers
4) Simulated effect of noise on the retrieved thickness and refractive index


Related Projects

Last updated on 2021-17-08 at 09:29