Title: Microwave cavity measurements and XRD spectra for annealed aluminium samples

Clark NS, Shaw G (2017). Microwave cavity measurements and XRD spectra for annealed aluminium samples. Cardiff University. http://doi.org/10.17035/d.2017.0038465971

Access Rights: Data can be made freely available subject to attribution
Access Method: Click to email a request for this data to opendata@cardiff.ac.uk

Cardiff University Dataset Creators

Dataset Details
Publisher: Cardiff University
Date (year) of data becoming publicly available: 2017
Data format: .tdms, .ini, .txt
Software Required: tdms requires LabVIEW or tdms excel plug-in.
Estimated total storage size of dataset: Less than 100 megabytes
Number of Files In Dataset: 10
DOI: 10.17035/d.2017.0038465971


The resonator parameters (frequency, Q-factor, insertion loss and 3dB bandwidth) are provided as produced from the lorenzian curve fitting procedure undertaken in software at the time of acquisition. Data is provided in the TDMS file format whereby each parameter is a separate data channel as it progresses in time. The different resonant modes and temperature data are organised into separate data groups. Each file is provided with a text file (.ini extension) which lists the network analyser parameters used for acquisition. 

The XRD data is provided in a simple plain text 2 column format (2theta and arbitrary intensity). The exposure time for each sample is identical so the data sets can be directly compared. The data has had the background pattern removed but still contains the Cu-Kalpha2 secondary peaks. 


Microwave Cavity Perturbation, stress, XRD

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Last updated on 2019-01-08 at 09:25