Title: Recent advances in dual mode charge compensation for XPS analysis

Citation
Morgan DJ, Edwards LE (2019). Recent advances in dual mode charge compensation for XPS analysis. Cardiff University. http://doi.org/10.17035/d.2019.0069433902


Access Rights: Data is provided under a Creative Commons Attribution (CC BY 4.0) licence
Access Method: Click to email a request for this data to opendata@cardiff.ac.uk

Cardiff University Dataset Creators

Dataset Details
Publisher: Cardiff University
Date (year) of data becoming publicly available: 2019
Data format: .opju
Software Required: Origin or Origin Pro v9 or above or the free Origin Viewer v9.6 or above
Estimated total storage size of dataset: Less than 100 megabytes
Number of Files In Dataset: 1
DOI: 10.17035/d.2019.0069433902

Description

Dual mode charge compensation has been used successfully for many years to enable X-ray photoelectron spectroscopy (XPS) analysis of a variety of insulating samples.  This approach uses a combination of low energy electrons and argon to compensate for positive charge build-up during irradiation by X-rays.  While this method works with no detectable side effects in most cases, it was recently reported that the chemical bonding states of some Cr(VI) oxides may be modified by prolonged exposure to the flood source.  In this work we demonstrate successful dual mode charge compensation of CrO3 with no discernible sample modification from the flood source.  Under the same flood source conditions, we extend the analysis to other systems known to undergo reduction and present charge compensated XPS data for V2O5 and a copper-based metal-organic framework (MOF) showing little or no modification from the flood source, even with prolonged exposure. Data relevant to the publication is provided as transmission corrected XPS data self-contained within an Origin Pro Workbook.

Research results based upon these data are published at https://doi.org/10.1002/sia.6680



Keywords

XPS

Related Projects

Last updated on 2019-06-08 at 09:13