Dr Yuran Niu
Setiau Data Ymchwil
- Coverage and Fluctuations Data for: 'Unified method for measuring entropy differences between coexisting surface phases using Low energy electron microscopy' - Ivanov M, Gomez D, Niu Y (2022). Cardiff University. 10.17035/d.2022.0216365941. III-V Semiconductors Surface Phase Separation
- Mapping the Surface Phase Diagram of GaAs(001) using Droplet Epitaxy - data - Pereiro J, Hannikainen K, Jesson DE, et al. (2019). Cardiff University. 10.17035/d.2019.0090902258. Microscopy - Electron/Proton (SEM/TEM/proton)(Instrumentation) Molecular Beam Epitaxy III-V Semiconductors
- Selected energy dark-field imaging using low energy electrons for optimal surface phase discrimination - Niu YR, Pereiro J, Gomez D, et al. (2019). Cardiff University. 10.17035/d.2019.0069660004. Molecular Beam Epitaxy III-V Semiconductors (Optoelectronic)
- Surface phase metastability during Langmuir evaporation: dataset - Hannikainen K, Gomez D, Pereiro J, et al. (2019). Cardiff University. 10.17035/d.2019.0085857240. Molecular Beam Epitaxy Surface Analysis III-V Semiconductors